ESD protection for USB3.0 low capacitance chip offers
The ESD7004 transient voltage suppressor is designed to protect high speed data lines from ESD. Ultra-low capacitance and low ESD clamping voltage make this device an ideal solution for protecting voltage sensitive high speed data lines. The flow-through style package allows for easy PCB layout and matched trace lengths necessary to maintain consistent impedance between high speed differential lines such as USB 3.0 and HDMI.
- Low Capacitance (0.2 pF Typical, I/O to I/O)
- Protection for the Following IEC Standards: IEC 61000-4-2 (±15 kV Contact)
- UL Flammability Rating of 94 V0
- This is a Pb-Free Device
- Low ESD Clamping Voltage
- USB 3.0
- Display Port
ON Semiconductor has introduced an electrostatic discharge (ESD) protection device designed for preserving signal integrity in high speed applications such as USB 3.0 (5Gbit/s) and eSATA (up to 6Gbit/s).
The device has a very low capacitance of just 0.4pF, while maintaining low ESD clamping voltage.
For data rates of 5Gbit/s and above a few tenths of a picofarad capacitance can have a major effect on the signal integrity of the data being transmitted, said the supplier.
“By lowering the capacitance down to 0.4 pF typical, 0.5pF maximum, the ESD7004 offers an ESD protection solution that has virtually no effect on eye diagrams of USB 3.0 at 5Gbit/s and eSATA at 6Gbit/s,” said the company.
The devices also have less than 1db insertion loss at over 8GHz during S21 measurements, ensuring negligible effect on high speed data transmission.
“The ESD7004 from ON Semiconductor addresses the needs of this trend by offering an ESD protection solution that protects sensitive chipsets without degrading the signal integrity of the high speed interfaces it is protecting,” said Gary Straker, vice president and general manager at ON Semiconductor.
The ESD7004 is designed to offer low clamping voltages and fast response time during ESD events. These designs boast clamping voltages at 11.4V or less during Transmission Line Pulse (TLP) +/-8A testing which safeguards chipsets using small geometries and low voltage tolerances, common for high speed datalines.
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